1) X-ray diffra-ctometer
逐层X衍射
2) X-ray diffraction
X-ray衍射
1.
Quantificational analysis method for the non-crystalline and crystalline contents in blast furnace slag was studied by means of X-ray diffraction.
通过X-ray衍射方法对高炉渣中非晶态与晶态的含量进行了定量分析研究。
2.
The coloring jadeite samples were analyzed with the infrared spectrum instrument and X-ray diffraction instrument.
以铬为注入元素,针对注入条件、热处理工艺进行了探索,对改色翡翠进行了红外和X-ray衍射分析,结合翡翠的致色成因理论,对改色结果进行了讨论。
3.
Different structures appeared when using different X-Ray diffraction measurement modes.
X-Ray衍射测试结果表明材料的择优取向随着功率的增大发生了规律性的变化,体现出了(220)方向择优,而且X-Ray衍射测试模式不同所揭示材料的结构信息也不一样。
3) XRD
X-衍射
4) X-ray diffraction
X衍射
1.
Powder X-ray diffraction analysis of Cornu Cervi Pantotrichum;
中药材鹿茸(花鹿茸)的X衍射Fourier谱分析
2.
The dawsonite in oil-bearing reservoir was identified accurately with X-ray diffraction method for the first time in China,and its diffraction characteristics was given in detail.
运用X衍射手段准确鉴定了石油储层中的碳钠铝石矿物,详细解析了其衍射曲线特征,这在我国尚属首次。
3.
The results of X-ray diffraction of single crystal D- and L-alanine at 300, 270, 250 K and neutron diffraction of D-alanine at 300,260, 250, 240 Kwere presented to look for the static and dynamical structure feature of Salam phase transition.
利用X衍射(300,270,250 K)和中子衍射(300,260,250,240 K)研究D-丙氨酸单晶在静态的和动力学的变温过程中的结构特征以及考证Salam预言的由D到L构型转变的可能性。
5) XRD
X光衍射
1.
XRD,SEM and hysteresis loop were measured to investigate and study the relationship between structure,microstructure and ferroelectric properties of Barium Titanate ceramics.
应用X光衍射谱、扫描电子显微镜以及电滞回线测量调查和研究所制备的钛酸钡陶瓷片的结构、微结构和铁电性质的关系,为未来铁电存储器材料的进一步开发和应用打下实验和技术基础。
2.
XRD, SEM, temperature and frequency dependence of dielectric constant, and hysteresis loop were measured to investigate and study structure, microstructure, dielectric and ferroelectric properties of Barium Titanate dielectric ceramics.
应用X光衍射谱、扫描电子显微镜、介电率的温度与频率依存关系以及电滞回线测量,调查和研究所制备的钛酸钡陶瓷的结构、微结构、介电和铁电性质。
3.
At the same time, the quality of the ZnO thin film is characterized by XRD and photo luminescence spectrum before and after annealed.
用等离子体辅助MOCVD法在蓝宝石 (α Al2 O3)上生长了ZnO薄膜 ,测试了其退火和未退火薄膜的电阻率、电子浓度、迁移率、激光阈值 ,并通过X光衍射、光致发光方法表征了ZnO薄膜的质量 ,其结果是 :退火薄膜的电子浓度低达 10 15/cm3 量级、激光阈值降低近 30倍、X光衍射峰半高宽是 0 。
6) X-diffraction
X-衍射
1.
The products in all stops were analyzed by~1H nuclear magnetic resonance(NMR),~(13)C NMR,infrared,mass spectrometry and X-diffraction.
通过对各步产物及最终化合物的1HNMR、13C NMR1、H1-3C COSY和IR、MS谱及X-衍射图的分析,对相关化合物进行了结构确证。
2.
Its structure was elucidated by 1H NMR,13C NMR,IR,MS,2D NMR and X-diffraction.
通过对反应产物的1H NMR、13C NMR、2D-NMR和IR、MS谱及X-衍射图的分析,对最终反应产物10-(5-氯-2,2,3,3,4,4,5,5-八氟-戊烷基)-11-(1-碘-甲基)-6,14-二氧杂-螺[4。
补充资料：参逐
1.犹行贿。
说明：补充资料仅用于学习参考，请勿用于其它任何用途。
参考词条