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1)  apparent defect
表观缺陷
1.
The apparent defect of some stainless steel products was analyzed by scanning electron microscope ( SEM ), X-ray Energy Dispersive Spectroscopy ( EDS ) and X-ray Wavelength Dispersive Spectroscopy ( WDS ).
利用扫描电子显微镜(SEM)及其附带的X射线能谱仪(EDS)、X射线波谱仪(WDS)对某些不锈钢制品的表观缺陷进行了较深入的分析。
2.
The factors affecting the common apparent defects of injection products are fully analyzed on the aspects of material,design of the mould,design of the product and forming techniques.
但注塑制品在成型过程中常会出现各种缺陷,从影响注塑制品质量的几个因素(材料、成型工艺、模具设计、制品设计)着手,分析了注塑制品常见的表观缺陷、产生的原因及其对策。
2)  concrete appearance defect
混凝土表观缺陷
3)  microdefect
微观缺陷
1.
Microdefects in binary TiAl alloys with different chemical compositions investigated by positron annihilation technique;
用正电子湮没技术研究不同化学成分的二元TiAl合金中的微观缺陷
2.
Effects of Zr on the Microdefects and Electronic State in Ni-Al Intermetallic Compounds;
Zr对Ni-Al系金属间化合物中微观缺陷和电子状态的影响
3.
Study of species characteristic and formation of microdefects in thermite welded joints in rails was described.
通过扫描电镜观察铝热焊接钢轨焊缝拉伸和冲击断口的断口形貌及能谱对缺陷进行成分分析,研究了使用中合格的铝热焊缝的微观缺陷的种类和形成机制。
4)  microdefects
微观缺陷
1.
Microdefects in nanocrystalline carbon;
纳米碳中的微观缺陷结构特征
2.
Change in Microdefects and Electron Density of Cuprate Superconductor with Temperatures;
高温超导体的微观缺陷和电子密度随温度的变化
3.
Positron annihilation of microdefects and 3d electrons in Zn-40Al alloy
Zn-40Al合金中微观缺陷和3d电子的正电子湮没
5)  macroscopic defect
宏观缺陷
1.
The macroscopic defects of hydrothermal KTP crystal are mainly twin and coalescence crystal,growth spine,cracks and inclusions.
本文报道了水热法KTP晶体的生长工艺及晶体生长形态,系统研究了水热法KTP晶体的宏观缺陷,其宏观缺陷主要为添晶、生长脊线、裂隙和包裹体。
2.
The macroscopic defects of KBBF are mainly twin and coalescence crystal,inclusions,macrosteps,growth striations and cracks.
其宏观缺陷主要为连生、孪生、包裹体 ,宏观生长台阶和条纹、开裂等。
6)  macroscopic defects
宏观缺陷
1.
The main macroscopic defects such as striations, side cores, bubbles, inclusions and stress birefringence were observed in as-grown Ce:YAG crystal by means of cross-polarized light microscope.
采用温度梯度法(TGT)成功生长了直径为76mm高光学质量的Ce:YAG高温闪烁晶体,采用偏光显微镜研究了Ce:YAG闪烁晶体中的主要宏观缺陷,观察到了生长条纹、侧心、气泡、包裹物以及应力双折射等宏观缺陷。
补充资料:点缺陷(见晶体缺陷)


点缺陷(见晶体缺陷)
point defect

  点缺陷point defeet见晶体缺陷。
  
说明:补充资料仅用于学习参考,请勿用于其它任何用途。
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