1) strain sweep
应变扫描
1.
In the strain sweep experiment, it was found that the critical strain applied to this waste liquor polymer solution was up to 0.
应变扫描实验得出甘蔗渣浆废液多聚物的临界应变达到0。
2) Variable-temperature Scanning
变温扫描
1.
Development and Application of Variable-temperature Scanning Probe Microscope;
实现变温扫描的扫描探针显微镜的发展与应用
3) Scan conversion
扫描变换
1.
This paper describes the theory and technology of scan conversion． Then introduces the scan double chip AL251 and its application． The technology of converting interlaced scanning to progressive scanning can improve the image quality and be used to produce digital television
首先介绍扫描变换的原理和方法，然后介绍一种可以实现这种变换的AL251芯片及其在实践中的典型应用。
4) scan distortion
扫描畸变
1.
This article introduces the reason why there s existing the distortions of the micro align models and explains what is cross distortion and scan distortion 340 and how to match the different "340".
叙述了340光刻机发生畸变的原因,并解释了什么是交叉畸变,什么是扫描畸变,并对如何进行两台340光刻机的匹配进行了探讨。
5) scanning distortion
扫描变形
1.
The scanning distortion of image processing and pattern recognition is very troublesome.
扫描变形在图形处理与目标识别中有非常不利的影响,如何确定扫描变形和减少扫描变形的影响并没有一般的方法,该文通过对比几何定位符的位置关系来确定扫描变形,并通过图形膨胀来消除扫描变形的影响。
6) variable frequency scan
变频扫描
补充资料：扫描电子显微镜(见扫描电子显微术)
扫描电子显微镜(见扫描电子显微术)
scanning eleetron mieroseoPe
扫描电子显微镜scanning eleetron mieroseope见扫描电子显微术。
说明：补充资料仅用于学习参考，请勿用于其它任何用途。
参考词条