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1)  SiGe mixed crystal
锗硅混晶
2)  poly-SiGe
多晶锗硅
1.
The crystal quality and morphology of poly-SiGe films were characterized by XRD and SEM.
采用金属Ni诱导与超高真空化学气相沉积(UHVCVD)相结合的方法,在热氧化硅衬底上生长了多晶锗硅薄膜。
3)  SiGe bulk
硅锗单晶
1.
The distribution of impurity Ge in SiGe bulk single crystal which was grown by varying speed CZ was measured by using the SEM-EDS methods, and it was found that the Ge concentration varied from a lower value at head to a highter one at the tail of Si crystal which was doped Ge.
利用扫描电镜能谱分析法,对 CZ 法生长的掺锗浓度不同的硅锗单晶中锗浓度进行了测定,结果发现硅中锗的纵向分布是头部浓度较低,尾部锗浓度较高。
4)  polycrystalline SiGe
多晶硅锗
1.
Effects of hydrogenation for polycrystalline SiGe (poly-Si1-xGex) thin films were estimated by investigating the dark conductivity and activation energy that derive from the conductivity as a function of the temperature.
优化了热丝法氢处理多晶硅锗薄膜工艺条件。
5)  nicrocrystalline silicon-germanium (μc-SiGe)
微晶硅锗
6)  SiGe single crystal
锗硅单晶
补充资料:氮化硅晶须补强碳化硅陶瓷复合材料
分子式:
CAS号:

性质:以碳化硅陶瓷为基体,以氮化硅晶须为增强体的复合材料。它既保留了碳化硅陶瓷优良的耐高温、抗蠕变、抗氧化、抗化学腐蚀、耐磨等性能,又具有比碳化硅陶瓷更高的强度和韧性,最高使用温度可达1400℃以上。由于氮化硅晶须与碳化硅陶瓷基体具有较好的物理相容性,化学性质相近,界面的结合力较强。该复合材料的烧结温度高,界面控制困难,成本高,主要用于航空、航天领域的高温部件。

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