1) discrete semiconductor testing system
半导体分立器件测试系统
1.
The discrete semiconductor testing system is significant for the semiconductor enterprises of packing and testing.
半导体分立器件测试系统是提升半导体分立器件测试和封装企业自动化水平的一种重要的检测设备。
3) discrete-semiconductor device
分立半导体器件
4) discrete semiconductor device
分立的半导体器件
5) ATS of semiconductor
半导体自动测试系统
6) semiconductor parallel system
半导体器件并联系统
1.
In order to improve the accuracy of the reliability evaluation for semiconductor parallel system, evaluated are the reliability for this system by using empirical Bayes and classical statistical methods.
为了提高机载开关电源中半导体器件并联系统可靠性评估的准确性,运用经验 Bayes 法和经典的统计方法,研究了该系统的可靠性评估问题。
补充资料：半导体导电性(见半导体的导电与电荷输运)
半导体导电性(见半导体的导电与电荷输运)
electrical conductivity of semiconductor
半导体导电性eleetr、ea一conou以，v:‘，_‘ 一J一“。，瓜米早伙鼓幕由乌教着给话_
说明：补充资料仅用于学习参考，请勿用于其它任何用途。
参考词条