1) measured conductor
![点击朗读](/dictall/images/read.gif)
被测导体
1.
Influence of measured conductor on output of characteristic CZF1 eddy-current sensor;
![点击朗读](/dictall/images/read.gif)
被测导体对CZF1型涡流传感器输出特性的影响
2.
The influence of different measured conductor on the output of the current eddy sensor is illustrated.
在实际测量中,被测导体对电涡流传感器输出信号的影响一般不被考虑。
2) metal conductor measured
![点击朗读](/dictall/images/read.gif)
被测金属导体
3) passive detection and guidance
![点击朗读](/dictall/images/read.gif)
被动探测与制导
1.
Under the actual threat of millimeter wave(MMW) passive detection and guidance, to enhance survivability of the ground object in the future battlefield,target s millimeter wave passive stealth technology research is conducted.
在毫米波被动探测与制导的实际威胁下,为提高地面目标在未来战场的生存能力,进行了目标的毫米波被动隐身技术的研究。
4) data carrier detected ,DCD
![点击朗读](/dictall/images/read.gif)
被检测数据戴体
5) memory under test
![点击朗读](/dictall/images/read.gif)
被测试记忆体
6) semiconductor test
![点击朗读](/dictall/images/read.gif)
半导体测试
1.
Compiling VCD to ATE recognized Patterns is an essential work to develop semiconductor test program.
在半导体测试程序开发中如何快速有效地进行VCD-模式的编译是一项重要的课题。
2.
Most semiconductor test problems are multiple resources constrained unrelated parallel machine scheduling problems with consideration of sequence-dependant setup times.
半导体测试是资金高度密集、涉及产品种类与设备种类繁多的半导体生产环节。
3.
Experiments show that Sarsa(λ,k)outperforms the scheduling method in industry and validate its effectiveness to solve the semiconductor test scheduling problem.
采用Sarsa(λ,k)学习算法求解、产品、测试机、测试工具包、使能器部件对应关系非常复杂的半导体测试调度问题。
补充资料:半导体导电性(见半导体的导电与电荷输运)
半导体导电性(见半导体的导电与电荷输运)
electrical conductivity of semiconductor
半导体导电性eleetr、ea一conou以,v:‘,_‘ 一J一“。,瓜米早伙鼓幕由乌教着给话_
说明:补充资料仅用于学习参考,请勿用于其它任何用途。
参考词条