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1)  X-ray spectrum
X射线能量谱
1.
Indirect measurement of X-ray spectrum;
X射线能量谱间接测量方法
2.
This paper presents a procedure for estimating the x-ray spectrum of industrial CT system.
本文研究的是工业CT中的X射线能量谱恢复问题。
3.
(1) Indirect measurement of X-ray spectrumWe propose an indirect measurement method to estimate the spectrum of X-ray source via the transmission data of a known wedge phantom.
本文针对工业CT应用需求和CT设备研制,研究了多能X射线CT问题和不完全数据的CT问题,主要工作如下:(1) X射线能量谱的间接测量方法提出了由特定材料“楔体”的扫描数据间接测量X射线能量谱的方法。
2)  EDS
X射线能谱
1.
Before and after treatment,the surface structure of JB-1 explosive was observed by scanning electron microscope (SEM),and its element concentration was analyzed by X-ray energy spectrum (EDS).
对以TATB为基的高聚物粘结炸药(JB1)进行了超声空化处理,并利用扫描电镜(SEM)观察了处理前后JB1炸药表面的细观形貌,用X射线能谱仪(EDS)检测了处理前后JB1炸药表面的相对元素含量。
2.
The mineralogical and petrological characteristics of the "glimmering" jadeite jade samples,which are of high value in the jewelry market at present,are studied by using X-ray powder diffraction(XRD),Fourier transform infrared spectroscopy(FTIR),X-ray energy dispersive spectrometer(EDS) and scanning electron microscopy(SEM).
采用X射线粉末衍射仪(XRD)、傅里叶变换红外光谱仪(FTIR)、X射线能谱仪(EDS)和扫描电子显微镜(SEM)等测试仪器对目前珠宝市场价值较高的"起荧"翡翠样品进行了矿物学、岩石学研究,并对其"起荧"现象的光学原理进行了初步探讨。
3)  X-ray energy spectrum
X射线能谱
1.
X-ray energy spectrum analysis of wild and artificial Gastrodiae;
野生和人工栽培天麻的X射线能谱分析
2.
By using scanning electron microscope and X-ray energy spectrum,the common trace elements,S,P,Ca,K,Fe,Cu and Zn contents in the pileus peel,context,and lamella were detected.
利用扫描电镜和X射线能谱仪对姬松茸菌株J3与原菌株J1子实体的菌盖皮、菌盖内和菌褶中常见的微量元素S、P、Ca、K、Fe、Cu和Zn进行了测定,计算了它们的相对重量百分比。
4)  X-ray spectrum
X射线能谱
1.
Measurement of DPF pulse X-ray spectrum;
DPF脉冲X射线能谱测量
5)  energy dispersive X-ray microanalysis
X-射线能谱
1.
Results by energy dispersive X-ray microanalysis showed that the relative content of sodium ion(Na+) and chloride ion(Cl-) significantly decreased,coupling wi.
X-射线能谱微域分析结果表明,盐胁迫下加Si,芦荟叶同化组织细胞中钠离子(Na+)和氯离子(Cl-)相对含量显著下降,伴随着钾离子(K+)相对含量显著升高、钾钠比(K+/Na+)显著增大。
6)  energy dispersive X-ray microanalysis system(EDS)
能量色散X射线谱
1.
The compositions of the coatings were analyzed by energy dispersive X-ray microanalysis system(EDS),and the morphology of the coatings was observed by scanning electron microscopy(SEM).
采用能量色散X射线谱(EDS)分析得出镀层成分,利用扫描电子显微镜(SEM)观察镀层形貌。
补充资料:δ射线能量损失
分子式:
CAS号:

性质:又称δ射线能量损失。指次级电子(又称δ射线)在带电粒子轨迹附近一定范围内损失能量而形成径迹的作用机制。

说明:补充资料仅用于学习参考,请勿用于其它任何用途。
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