1) gas-phase crystallization
气相结晶
2) vapor crystallization model
气相结晶模型
1.
The vapor crystallization theory was applied to the crystallization process, and the vapor crystallization model was simulated.
研究了氟化氢铵气相合成新工艺,应用气相结晶理论验证了气相结晶过程,拟合得到了适合于该过程的气相结晶模型,确定了颗粒平均粒径和流体流速之间的关系。
3) vapor-induced crystallization
气相诱导结晶
4) crystalline structure
晶相结构
1.
Influence of K_2O impurity on the crystalline structure of cordierite synthesized from waste aluminum slag;
K_2O杂质对铝型材厂工业废渣合成的堇青石材料晶相结构的影响
2.
Effects of preparation methods on crystalline structure of Ni-Mo oxide catalysts;
制备方法对Ni-Mo氧化物催化剂晶相结构的影响
3.
Using the technologies such as X-ray diffraction (XRD) and Scanning electron microscope (SEM), the article discussed the influence of the factors such as crystalline structure of standards and samples and their preparation on the analytical result when analyzing silicon dioxide content in organic glass filler ash with X-ray fluorescence spectrometry (XRF
利用X射线衍射(XRD)和扫描电子显微镜(SEM)等分析技术,探讨了用X射线荧光光谱法(XRF)分析有机玻璃填料灰渣中二氧化硅含量时标样和样品晶相结构及样品制备方法等因素对分析结果的影响。
5) crystal structure
晶相结构
1.
Dipping SiC refractory with AlPO4 saturated solution is beneficial to its crystal structure and properties.
浸渍AlPO4饱和溶液有利于SiC耐火材料晶相结构的转化,有利于材料性能的优化。
2.
The changes of crystal structure and properties of ceramic roller during its application in the roller hearth kiln were studied.
采用XRD和SEM方法表征不同位置辊棒的晶相结构与显微结构来探讨陶瓷辊棒在实际窑炉使用过程晶相结构和性能变化。
3.
The effects of PAM and microwave treatment on the morphology,particle size and crystal structure of the material were characterized by SEM,laser particle size analysis and XRD techniques.
通过SEM、激光粒度分析和XRD等技术,研究了PAM和微波处理对材料的形貌、粒度和晶相结构的影响。
6) crystalline phase
晶相结构
1.
X-ray diffraction and scanning electron microscope were used to characterize the crystalline phases and microstructures.
5H2O]为主要原料合成镁铝尖晶石(MgAl2O4),探讨氧化钛(TiO2)矿化剂对合成的MgAl2O4晶相结构、晶胞参数及微观形貌的影响。
2.
X-ray diffraction (XRD) and scanning electron microscopy (SEM) were used to characterize the crystalline phases and microstructures; Rietveld Quantification software was used to calculate the content of each phase.
采用XRD法和SEM法表征各试样的晶相结构和显微结构;用Rietveld Quantification法确定各试样中各晶相的含量;测试各试样的性能。
3.
XRD and SEM were used to characterize the crystalline phases and microstructures.
采用XRD和SEM表征试样的晶相结构和显微结构;用Rietveld Quantification法确定各试样中各晶相含量;测试各试样的性能。
补充资料：二次再结晶(见再结晶晶粒长大)
二次再结晶(见再结晶晶粒长大)
secondary recrystallization
erCI 201」le」Ing二次再结晶(seeondary reerystallization) 见再结晶晶杠长大。
说明：补充资料仅用于学习参考，请勿用于其它任何用途。
参考词条