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1)  The Optical Probe Topography Measurement System
光探针形貌测量
2)  Probe shape
探针形貌
3)  Topography measurement
形貌测量
1.
Digital holography is a technology that has characteristics of simple and convenient measurement, non-contact, high resolution in topography measurement of 3D object’s surface, and has a wide perspective in application.
数字全息技术用于物体表面三维形貌测量具有测量简便、快捷、无接触、高分辨率的特点,有着广阔的应用前景。
4)  profile measurement
形貌测量
1.
The latest development of optical non-contact 3D profile measurement;
光学非接触三维形貌测量技术新进展
2.
Application of generalized B spline filter to surface profile measurement;
广义B样条滤波器在表面形貌测量中的应用
3.
The 3D profile measurement technology has widely application and promising future in fields of industrial online inspection, robotic vision, biomedicine etc.
物体的三维形貌测量在工业检测、机器视觉、医学等众多领域有着广泛的应用。
5)  Shape measurement
形貌测量
1.
Analysis of the shape measurement by carrier modulation in electronic speckle pattern interferometry
电子散斑干涉载频调制形貌测量方法的分析
2.
A shape measurement based on electronic speckle pattern interferometry(ESPI)by carrier modulation is presented.
用摄像机采集该载波条纹图,利用傅里叶变换法可解调出物体高度的位相信息,从而实现物体的形貌测量。
3.
A method of shape measurement based on ESPI carrierfrequency modulation is presented.
用CCD采集该载波条纹图,利用傅里叶变换法可解调出物体高度的位相信息,从而实现物体的形貌测量。
6)  Obtainment of Probe Shape
探针形貌的获取
补充资料:电子探针(见电子探针显微分析)


电子探针(见电子探针显微分析)
electron probe

气二J一,不f丁electron orobom由不,‘.,*二
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