1) access probe
直观探针
2) rectal probe
直肠探针
3) collinear four probe array
直排四探针
1.
The resistivity of polished silicon wafers can be reduced by reducing the surface recombination and increasing the measuring current intentionally during the measurement of resistivity with a collinear four probe array.
用直排四探针方法测试硅抛光片的电阻率时 ,减少表面复合和增大测试电流故意引进注入使电阻率减少 ,根据电导率与少数载流子寿命成正指数增加的关系 ,求得少子寿
4) direct insertion probe
直插式探针
5) method of DC probe's pressure descending
直流探针压降法
6) Enzyme direct labelling DNA probe
直接酶标DNA探针
补充资料：电子探针(见电子探针显微分析)
电子探针(见电子探针显微分析)
electron probe
气二J一，不f丁electron orobom由不，‘.，*二
说明：补充资料仅用于学习参考，请勿用于其它任何用途。
参考词条