1.
Analysis of Uncertainty of Non-Weighted Measurement In Uniform Thickness Interference
等厚干涉中非等精度测量的不确定度分析
2.
Studies of Auto Measuring System of Curvature Radius of Optical Sphere on White Light s Equal Thickness Interference Principle;
基于白光等厚干涉原理的光学球面曲率半径自动测量系统研究
3.
Thermal Refractive Index Coefficients of Colorless Optical Glass and Equal Thickness Interference Fringe of Optical Flat
无色光学玻璃折射率温度系数与平晶等厚干涉条纹
4.
Impact of glass thickness of the Michelson interferometer on the interference fringe
玻片厚度对迈克耳孙干涉仪干涉条纹的影响
5.
Measuring thickness of epitaxial layers of gallium arsenide by infrared interference
GB/T8758-1988砷化镓外延层厚度红外干涉测量方法
6.
Study on the Thickness and Characteristics of Oil-film on Watersurface Based on White-light Interferometer;
水面油膜厚度及油品特性的白光干涉测量研究
7.
Refractive Index and Thickness of Michelson Interferometer Measure Film;
迈克尔逊干涉仪测量薄膜的折射率与厚度
8.
A Study on Acoustic Impedance Matching Criteria for Coating Thickness Measurement by Ultrasonic Interferometry
超声干涉法涂层厚度测量声阻抗匹配判据研究
9.
Thickness Measurement of Thin Film Based on White-Light Spectral Interferometry
基于白光干涉的光学薄膜物理厚度测量方法
10.
Measuring thin-film thickness with phase-shift interferometry
基于相位偏移干涉术的薄膜厚度测量方法
11.
Contoured Correlation Interferometry for Electronic Speckle Pattern Interferometry and Synthetic Aperture Radar Interferometry;
电子散斑与合成孔径雷达干涉测量中的等值线相关干涉法
12.
THE THICKNESS AND REFACTURE INDEX OF SINGLELAYER FILM MEASURED BY MICHELSON INTERFEROMETER
用迈克尔逊干涉仪测量单层薄膜的厚度和折射率
13.
Theory and System Research for Ultra-Thin Metallic Foil Thickness Measurement Based on White Light Interference;
基于白光干涉的金属极薄带测厚理论与系统研究
14.
Acoustic Impedance Matching Criteria and Their Applications for Layer Thickness Measurement by Ultrasonic Interferometry
超声干涉法薄层厚度测量声阻抗匹配判据及其应用
15.
Diagnostics of the Electric Arc Plasma by Mono-wavelength Laser Interferometry with Optical Flat
电弧等离子体的单波长激光平晶干涉诊断
16.
Diagnosing Microwave Plasma Thruster s Plume by Holographic Interferometry;
等离子体羽流场的光学全息干涉度量技术研究
17.
Differential Laser Interferometry for Dense Plasma Density Measurement;
激光差分干涉测量稠密等离子体密度技术研究
18.
A Multi-frame Mach-Zehnder Interferometer for Measuring the Plasma of Z-Pinch;
用于Z箍缩等离子体诊断的多幅M-Z干涉仪