1.
Debug System of RAM Chip and Its ASIC Design;
RAM芯片测试系统及其专用芯片设计
2.
The Speed Measure and Control of Handler Test Machine
IC芯片测试设备机械抓手的速度测控
3.
Test Pattern Generation and Fault Simulation for JX5 Microprocessor;
JX5芯片测试码的产生及故障模拟
4.
Research of Testing Method for RAM Chips Applied in UVA Control System
无人机控制系统RAM芯片测试方法研究
5.
Research of Semiconductor Chip Test Data Transmission Method
半导体芯片测试数据传输方法的研究
6.
A Test Scheduling Method of SOC using Evolutionary Programming
一种基于进化规划的系统芯片测试调度方法
7.
Research on the Design Optimization Techniques for System-On-Chip Testing
面向系统芯片测试的设计优化技术研究
8.
The DFT and Test Generation of Garfield;
Garfield芯片的可测性设计及测试生成
9.
The Research on SoC Test and Design for Testability;
系统级芯片的测试与可测性设计研究
10.
Design-for-Testability and Test of Garfield Series SoC’s
Garfield系列SoC芯片可测性设计与测试
11.
ATE Test Solution for RFID Device;
RFID芯片在ATE上测试解决方案的研究
12.
Simulation and Test for PDVQ Image Compression Chip;
PDVQ图像压缩芯片仿真验证及测试
13.
The Research on Test Data Compression of System-on-a-Chip (SoC);
系统芯片SoC测试数据压缩方法研究
14.
The Verification and Test of Satellite Data Receiving Chip IPoD For DVB;
DVB卫星数据接收芯片IPoD的验证和测试
15.
Development of Test Program for A/D Module of PCU03-ABS;
PCU03-ABS芯片A/D模块测试程序开发
16.
Design and Measurement of Millimeter-Wave Vector Modulator
毫米波矢量调制器芯片的设计和测试
17.
Applications of SN74ACT8990 in Digital Circuits Test
SN74ACT8990芯片在数字电路测试中的应用
18.
Testing of the ASIC System of Intelligent AC Contactor
智能交流接触器专用芯片系统的测试