1.
HRTEM investigation of gold nanoparticles
金纳米颗粒的高分辨电子显微学研究
2.
Recent developments in high-resolution electron microscopy--Sub-Angstrom electron microscopy era in sight
高分辨电子显微学的新进展——走向亚埃电子显微时代
3.
HRTEM investigation of microstructural defects in Si nanocrystals
硅纳米晶微观结构缺陷的高分辨电子显微学研究
4.
high resolution electron microscope (HREM)
高分辨率电子显微镜
5.
ultra high resolution scanning electron microscope
超高分辨率电子扫描显微镜
6.
Study of Microstructure and Nitride in Ion-nitrided Pure Iron with High Resolution Electron Microscope;
纯铁表面离子渗氮层显微组织及氮化物的高分辨电子显微镜研究
7.
Image contrast and deconvolution processing of spherical aberration-corrected high-resolution electron microscope images
球差校正高分辨电子显微像的像衬和解卷处理
8.
High Resolution Transmission Electron Microscopy Study of Microstructures of the Dielectric and Colossal Magneto-resistance Materials;
电介质和庞磁电阻材料微结构的高分辨透射电子显微术研究
9.
Analyzing the Oxygen Vacancy Microstructure of ZrO_2 by High Resolution Electron Microscope
ZrO_2氧空位显微结构的高分辨电镜研究
10.
W. J. Jing, Z. Zhang and K. H. Kuo, "HREM study of translation twins in NiZr", Phys. Stat. Soli. (a) 92 (1985) K5.
“镍锆合金中平移畴的高分辨电子显微研究”,杂志>,(国际).
11.
REW-the program package for HRTEM image simulation and exit wave reconstruction
REW软件——高分辨电子显微镜的像模拟与出射波函数重构的应用软件
12.
To be able to identify major subcellular structures on an electron micrograph.
分辨电子显微镜底下主要的次细胞结构。
13.
The particle size was measured with UV absorption spectrometry in-situ and high resolution transmission electron microscope (HRTEM).
分别用高分辨率电子显微镜及原位紫外吸收光谱测定了粒子大小及分布.
14.
High Time-Resolved Near-Field Scanning Optical Microscopy
高时间分辨近场扫描光学显微术的研究
15.
High resolution transmission electron microscopy (HRTEM) and infrared spectroscopy (FTIR) were employed to characterize this nanohybrid material.
对这种纳米材料进行了高分辨透射电子显微镜结构分析与傅立叶变换红外光谱表征。
16.
electron microscope microanalyser
电子显微镜微量分析器
17.
Design and implementation of optical micro-scanning thermal microscope imaging system with high resolution
高分辨力光学微扫描显微热成像系统设计与实现
18.
Researches on Key Technology to Improve Resolution of the Microscopic Imaging;
提高显微成像分辨率关键技术的研究