1.
hot carriers in semiconductors
半导体中的热载流子
2.
Evaluation of Hot Carrier Effect of SiGe HBT
SiGeHBT的热载流子效应评价
3.
Study of Hot-carrier Degradation Effects of MOSFET;
MOSFET热载流子退化效应的研究
4.
The Study on the Hot-Carrier Effect in Deep Sub-Micron MOSFET;
深亚微米MOS器件热载流子效应研究
5.
Research on MOSFET Noise and Hot Carrier Effect;
MOSFET噪声与热载流子效应研究
6.
Research on Hot-carrier Effects for Deep-submicron LDD MOSFET
深亚微米LDD MOSFET器件热载流子效应研究
7.
Mixed Degradation Mode of DEMOS Under Hot-Carrier Stress
DEMOS在热载流子应力下的混合失效模式
8.
A Study of Hot Carrier Effects on Polysilicon Thin Film Transistors by Simulation
多晶硅TFT热载流子效应的模拟研究
9.
Investigation on pMOSFET During Hot-Carrier Degradation by DCIV Method
基于DCIV法对pMOSFET热载流子损伤的研究
10.
Self-heating Effect and Hot-carrier Effect of Strained-Si CMOS
应变硅CMOS器件的自热效应与热载流子效应
11.
Study on Hot-carrier Effect in Ultra-deep Submicronmeter MOSFET;
超深亚微米MOSFET器件中热载流子效应的研究
12.
Study on Hot-Carrier-Induced Reliability Priblems and Lifetime Prediction Method in PMOSFET s;
PMOSFET s热载流子可靠性及其寿命评估方法研究
13.
The Influence of Hot Carrier s Retrogradation on IC s Reliability and the Countermeasures;
热载流子退化对集成电路可靠性的影响及应对
14.
Studies of the LDD Process for HCE Improvement
抗热载流子效应的工艺及器件结构研究
15.
The Research of Hot-Carrier Effect and NBTI Effect on Ultra Thin Gate Oxide PMOS Device
超薄栅PMOS器件热载流子效应和NBTI效应的研究
16.
Hot-Carrier-Induced Degradation of MOSFETs and a Model to Extrapolate the Lifetime
MOSFET的热载流子效应及其寿命的评估方法
17.
Study on the Modeling and Hot Carrier Induced Reliability of Ultra-deep Submicrometer LDD MOSFETs;
超深亚微米LDD MOSFET器件模型及热载流子可靠性研究
18.
Hydrogenation Effects on the Hot-Carrier Degradation of MILC n-Type Poly-Si TFTs;
氢化对金属诱导横向结晶n型多晶硅TFT热载流子退化的影响