1.
The Function Expansion and Data Processing of Nanometer Phase-shifting Interferometer for Micro-surface Profile Measurement;
纳米级微表面干涉形貌检测仪的功能扩展和数据处理
2.
Research on Laser-interference Profilometer with Large Range for Surface Measurement;
激光干涉式大量程表面轮廓仪的研制
3.
Fabricating Micro-grating Structures on Nickel Using Interference Laser
镍金属表面双光束激光干涉直写研究
4.
Research of Micro-surface Profilometry Based on Phase-stepping Interferometer;
基于相移干涉法的微表面轮廓仪的研究
5.
Optical Determination of a Surface Acoustic Wave Using Light Interference and Light Diffraction;
低频液体表面波激光的干涉和衍射研究
6.
Research on Precise On-line Surface Measurement by Synchronism Phase-shifting Shearing Interference;
同步相移剪切干涉在线表面精密测量研究
7.
Research on Measurement of 3D Surface Topography Based on Scanning White-light Interferometry;
白光扫描干涉三维表面形貌测量技术的研究
8.
The Further Discussion on the Paper of Testing Surface by Interference Mmethod;
对“干涉法检查工件表面再探究”一文的几点补充
9.
Research on the Interference Nanosecond Laser Ablation of Micro-grating Structures on the Silicon Surface
硅表面微光栅结构的纳秒激光干涉刻蚀研究
10.
Out-of-Plane Displacement Measurement by Using Electronic Speckle Pattern Interferometry
利用电子散斑干涉法测量金属表面的位移场
11.
Research on phase-shifting interferometry contrast three-dimensional topography of ultra precision surface
超精表面三维形貌相移干涉检测实验研究
12.
Surface Roughness Measurement System Based on Interference Image Processing
基于干涉图像处理的表面粗糙度检测系统
13.
The interference effect study of the small amplitude of the liquid surface wave at low frequency range
小振幅低频液体表面波的光学干涉效应的研究
14.
Non-uniform Distribution of Interference Fringe Intensity on the Liquid Surface and the Attenuation Effect of Surface Acoustic Waves;
液体表面波干涉条纹强度的非均匀分布及表面波的衰减效应
15.
On the Three Dimension Distributing with White Light Interferometer;
用低相干光干涉测绘物体表面三维轮廓的立体分布
16.
Don't show your face on my property again.
别再出面干涉我的财产
17.
Here the interference pattern is established between an optical flat and the polished specimen surface of the glass.
在光学平板玻璃和磨光试样表面之间建立起干涉图样。
18.
Research of Nanometer White-light Phase-shifting Interferometry and Instrumentation Used for Micro-surface Topography Measurement;
用于微表面形貌检测的纳米级白光相移干涉研究及仪器化