1.
Research on the Technique of Determining the Resistivity of Micro Areas Sheet;
大型硅片内微区薄层电阻均匀性测试技术研究
2.
Research on the Micro-Area Sheet Resistance Test System Based on EIT Technology
基于EIT技术的微区薄层电阻测试系统研究
3.
Study on the Four Point Probe Technique for the Sheet Resistance Measurement of the Micro-Area Integrating with Image Analysis;
结合图像分析的微区薄层电阻四探针测试技术研究
4.
Study on Silicon Sheet s Micro-Area s Resistance Stability Measured by Four Point Probe Method;
用四探针法测试硅片微区薄层电阻的稳定性研究
5.
Studies on Magnetoresistance in Fe/In/Fe Trilayers;
Fe/In/Fe三层薄膜磁电阻效应的研究
6.
Test method for measuring resistivity of semiconductor silicon or sheet resistance of semiconductor films with a noncontact eddy-current gage
GB/T6616-1995半导体硅片电阻率及硅薄膜薄层电阻测定非接触涡流法
7.
Tantalum nitride thin film chip resistor with top surface termination for microwave circuit
微波电路用共面电极TaNx薄膜片式电阻器
8.
Application Research of Incremental Frication and Colorized Folium on Pavement of Highway in Cold Zone
寒区公路路面增摩阻彩色薄层应用研究
9.
Sheet Sectional and Microsurgical Anatimic Studies of Orbital Apex Region;
眶尖区薄层断层解剖和显微外科解剖学研究
10.
Microsurgical and Sheet Sectional Anatomic Study of the Pterygopalatine Fossa Region;
翼腭窝区显微外科解剖与薄层断层解剖学研究
11.
Nondestructive measurement of microwave surface resistance of HTS at multifrequency
高温超导薄膜微波表面电阻多频点无损测试
12.
Microstructure investigation for the interface of electric resistance welded Cu/Al thin walled tube
薄壁铜铝管电阻焊焊接界面的微观结构研究
13.
Influence of Buffer Layer on the Anisotropic Magnetoresistance of NiCo Films;
缓冲层对NiCo薄膜各向异性磁电阻的影响
14.
Fabrication and Application of Electrolyte Film with YSZ as Block Film
带有YSZ阻挡层的电解质薄膜的制备及应用研究
15.
Effects of Al_2O_3 Layer on Performance of Ultrathin Permalloy Films
Al_2O_3层对超薄各向异性磁电阻薄膜性能影响的研究
16.
The Effect of TiO_2 Buffer Layer on the Microstructure and Ferroelectric and Magnetic Properties of BiFeO_3 Films;
TiO_2过渡层对BiFeO_3薄膜微结构和铁电磁性质的影响
17.
Technology of Multilayers Structure in Thin Film Microwave and Millimeter Wave Integrated Circuits
多层结构微波毫米波薄膜电路制作工艺研究
18.
TEM Investigation of Microstructure Effect on Pt_(0.55)Mn_(0.45)/Ni_(80)Fe_(20) Systemn by Nanometer Cr Layer Addition into PtMn Film;
纳米级Cr薄层对PtMn/NiFe钉扎薄膜显微结构影响的电镜观察