1.
large scale integrated circuit testing techniques
大规模集成电路测试技术
2.
Laser defect detection techniques for very large scale integration(VLSI) wafers
超大规模集成电路芯片的激光缺陷检测技术
3.
Laser repair techuipue fos Lsi photomasrs
大规模集成电路掩模缺陷激光修正技术
4.
Application Specific Integrated Circuit Test Research in Memory Testing;
存储测试专用集成电路成测技术研究
5.
Development of New Generation High Temperature Dynamic VLSI Burn-in Test System
新一代大规模集成电路高温动态老化测试系统的研制
6.
New Type Dc Parameters Automatic Test System of VLSI;
新型超大规模集成电路（VLSI）直流参数自动测试系统
7.
large scale compound integration
大规模组合集成电路
8.
large-scale integrated memory
大规模集成电路存储器
9.
large scale integrated chip
大规模集成电路芯片
10.
large scale hybrid integrated circuit
大规模混合集成电路
11.
matrix large scale integration
矩阵型大规模集成电路
12.
The ICs Test Method Analysis and Simulate Realization;
中小规模集成电路测试方法的分析与仿真实现
13.
Research and Design of the MSI Integrated Circuit Automatic Test System
中小规模集成电路自动测试系统的研究与设计
14.
Technological development aims for these kinds of LSI designs and manufacturing processes.
技术的发展正是瞄准了这种大规模集成电路的设计和制造过程。
15.
The Study of the CMP Technology of SiO_2 ILD in ULSI;
超大规模集成电路二氧化硅介质层的化学机械抛光技术的研究
16.
A Study on the CMP of Coper for Mulilevel Metallization in ULSI;
甚大规模集成电路铜布线工艺中化学机械抛光技术的研究
17.
Application of Virtual Instruments Technique in HIC Testing;
虚拟仪器技术在厚膜混合集成电路测试中应用
18.
Implementation of Mixed-Signal Integrated Circuits Boundary-Scan Test
混合信号集成电路边界扫描测试技术的实现